Images à titre indicatif uniquement
SN74BCT8244ADWR
+NomenclatureIC SCAN TEST DEVICE BUFF 24-SOIC
-
FabricantTexas Instruments
-
Pièce fabricant #SN74BCT8244ADWR
-
Fiche technique SN74BCT8244ADWR DataSheet
-
Package 24-SOIC (0.295, 7.50mm Width)
-
En stock8267
365 Garantie qualité 24h/24
7*24 Garantie de service 24h/24
90-Garantie après-vente 24h/24
Garantie produit authentique
Spécifications
| Attribut | Valeur |
| Supplier | Texas Instruments,Rochester Electronics, LLC |
| Package | Tape & Reel (TR),Bulk |
| Series | 74BCT |
| ProductStatus | Discontinued at Digi-Key |
| LogicType | Scan Test Device with Buffers |
| SupplyVoltage | 4.5V ~ 5.5V |
| NumberofBits | 8 |
| OperatingTemperature | 0°C ~ 70°C |
| MountingType | Surface Mount |
| Package/Case | 24-SOIC (0.295, 7.50mm Width) |
