Images à titre indicatif uniquement
SN74LVTH18646APM
+NomenclatureIC SCAN-TEST-DEV/XCVR 64-LQFP
-
FabricantTexas Instruments
-
Pièce fabricant #SN74LVTH18646APM
-
Package 64-LQFP
-
En stock3587
365 Garantie qualité 24h/24
7*24 Garantie de service 24h/24
90-Garantie après-vente 24h/24
Garantie produit authentique
Spécifications
| Attribut | Valeur |
| Supplier | Texas Instruments |
| Package | Tray |
| Series | 74LVTH |
| ProductStatus | Active |
| LogicType | ABT Scan Test Device With Transceivers and Registers |
| SupplyVoltage | 2.7V ~ 3.6V |
| NumberofBits | 18 |
| OperatingTemperature | -40°C ~ 85°C |
| MountingType | Surface Mount |
| Package/Case | 64-LQFP |
Présentation
Description
Equivalent
Pinout
Function: Octal bidirectional buffer/driver (8-bit transceiver) with 3-state outputs. It connects two 8-bit buses (A0–A7 and B0–B7); direction is controlled by DIR and outputs are enabled/disabled by OE (tri-state).
Manufacturer
- What kind of company: A multinational American semiconductor company that designs and manufactures analog and digital integrated circuits.
Application
- 16-bit bidirectional bus buffering and isolation between microprocessors/memory and peripherals (3-state outputs to prevent bus contention).
- Memory and I/O bus interfacing, buffering data/address lines in embedded systems.
- Backplane/inter-board data paths and bus expansion in consumer, automotive, and telecom equipment.
- Mixed-voltage/bus interfacing (level shifting between different logic families) where fast, low-power 3-state drivers are needed.
Note: It is a high-speed, low-voltage, tri-state bus transceiver/driver suitable for any application requiring a buffered, controllable data bus.