Images à titre indicatif uniquement
LM4040D50IDBZR
+NomenclatureIC VREF SHUNT 1% SOT23-3
-
FabricantTexas Instruments
-
Pièce fabricant #LM4040D50IDBZR
-
Package SOT-23-3
-
En stock7565
365 Garantie qualité 24h/24
7*24 Garantie de service 24h/24
90-Garantie après-vente 24h/24
Garantie produit authentique
Spécifications
| Attribut | Valeur |
| Package / Case | Tape & Reel (TR),Cut Tape (CT) |
| Part Status | Active |
| Reference Type | Shunt |
| Output Type | Fixed |
| Voltage - Output (Min/Fixed) | 5V |
| Current - Output | 15 mA |
| Tolerance | ±1% |
| Temperature Coefficient | 150ppm/°C |
| Noise - 10 Hzto10k Hz | 80µVrms |
| Current - Cathode | 95 µA |
| Operating Temperature | -40°C ~ 85°C (TA) |
| Mounting Type | Surface Mount |
Présentation
Description
Key points:
- Fixed, low-noise reference with low dynamic impedance and good temperature stability
- Sits as a shunt regulator: bias from V+ through a resistor; cathode to the reference node, anode to ground
- Simple, low-component reference solution for microcontrollers, ADCs, and precision regulators
Package/ordering:
- IDBZR indicates Pb-free, RoHS-compliant package (D-3 pin, SOT-23 style) with standard TI packaging
Note:
- Check the TI datasheet for exact operating current range, temperature coefficient, tolerance, and recommended bias resistor values.
Equivalent
Pinout
- Function: Fixed shunt voltage reference diode (LM4040D50), provides a precise reference voltage (nominal 50 mV) by shunting current.
Manufacturer
- What kind of company: An American multinational semiconductor company that designs and manufactures analog and mixed-signal integrated circuits and other electronic components.
Application
- Generate a stable reference voltage for ADC/DAC in instrumentation and microcontrollers
- Reference input for voltage regulators and power-management circuits
- Biasing/offset references for op-amps and comparators
- Sensor interfaces and measurement front-ends in portable or battery-powered devices
- LED-driver and current-sensing circuits requiring a stable reference
- Data acquisition systems and test equipment for improved accuracy